ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 45355 | ISO/WD 29222 | Standards for thickness measurement of thin films by TEM-EELS and STEM-EDS analytical electron microscopy at the nanometer and sub-nanometer level | Izstrādē |
| 42952 | ISO/NP 25499 | Guidelines for the energy calibration and energy resolution determination methods for electron energy loss spectroscopy | Izstrādē |
| 42951 | ISO 25498:2010 | Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope | Atcelts |
| 42950 | ISO/NP 25497 | Guidelines for the determination of experimental parameters for electron energy loss spectroscopy | Izstrādē |
| 32939 | ISO/CD 17270 | Analytical electron microscopy — Test method to determine experimental parameters for electron energy loss spectroscopy (EELS) | Izstrādē |
Displaying 21-25 of 25 results.