ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 92612 | ISO/CD 26100 | Microbeam analysis — Analytical electron microscopy — The thickness measurement of thin foil by electron energy loss spectroscopy | Izstrādē |
| 91808 | ISO/CD 25871 | Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction | Izstrādē |
| 91667 | ISO/PWI 25836 | Microbeam analysis – Analytical electron microscope - Phase identification of metals and oxides by precession electron diffraction | Izstrādē |
| 91666 | ISO/NP 25835 | Microbeam analysis — Analytical electron microscopy — Method for data acquisition and processing of three-dimensional electron diffraction | Izstrādē |
| 90100 | ISO 25387:2026 | Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope | Standarts spēkā |
| 90097 | ISO/PWI 25386 | Microbeam Analysis-Analytical Electron Microscopy-The main performance parameters and design specifications of the TEM standard grid | Izstrādē |
| 87733 | ISO 25498:2025 | Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope | Standarts spēkā |
| 87682 | ISO 20263:2024 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials | Standarts spēkā |
| 86942 | ISO 29301:2023 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures | Standarts spēkā |
| 86203 | ISO 19214:2024 | Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy | Standarts spēkā |
Displaying 1-10 of 25 results.