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Displaying 26377-26388 of 27364 results.

LVS EN 62047-1:2006

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EN
Semiconductor devices - Micro-electromechanical devices -- Part 1: Terms and definitions
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18.53 €
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LVS EN 62047-12:2012

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EN
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011)
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19.44 €
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LVS EN 62047-13:2012

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EN
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (IEC 62047-13:2012)
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13.97 €
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LVS EN 62047-14:2012

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Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (IEC 62047-14:2012)
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14.87 €
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LVS EN 62047-18:2014

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EN
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (IEC 62047-18:2013)
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13.05 €
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LVS EN 62047-19:2014

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EN
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013)
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19.44 €
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LVS EN 62047-2:2007

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EN
Semiconductor devices - Micro electromechanical devices - Part 2: Tensile testing method of thin film materials
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13.05 €
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LVS EN 62047-3:2007

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EN
Semiconductor devices - Micro electromechanical devices - Part 3: Thin film standard test piece for tensile-testing
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11.25 €
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LVS EN 62047-4:2011

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EN
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specifications for MEMS (IEC 62047-4:2008)
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16.40 €
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LVS EN 62047-5:2011

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EN
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (IEC 62047-5:2011)
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21.25 €
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LVS EN 62047-6:2010

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EN
Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
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13.97 €
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LVS EN 62047-7:2011

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EN
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011)
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19.44 €
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