31.080 Semiconductor devices
| # | Name |
|---|---|
| 31.080.01 | Semiconductor devices in general |
| 31.080.10 | Diodes |
| 31.080.20 | Thyristors |
| 31.080.30 | Transistors |
| 31.080.99 | Other semiconductor devices |
Displaying 1-12 of 15 results.
LVS HD 576 S1:2005
standard
EN
IEC 60822 VSB - Parallel sub-system Bus of the IEC 60821 VMEbus
31.42 €
LVS EN 60191-4:2014
standard
EN
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (IEC 60191-4:2013)
15.31 €
LVS EN 60191-4:2014/A1:2018
amendment
EN
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
12.15 €
LVS EN 60749-21:2005
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
14.26 €
LVS EN 60749-29:2004 +AC
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
15.31 €
LVS EN 60749-34:2004
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
9.78 €
LVS EN 62373:2006
standard
EN
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
11.35 €
LVS EN 62374-1:2011
standard
EN
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010)
12.15 €
LVS EN 62374-1:2011 /AC:2011
corrigendum
EN
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
0.00 €
LVS EN 62374:2008
standard
EN
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
15.31 €
LVS EN 62415:2010
standard
EN
Semiconductor devices - Constant current electromigration test
10.56 €
LVS EN 62416:2010
standard
EN
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
9.78 €