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Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz - Part 1: Fields produced by devices used for electronic article surveillance, radio frequency identification and similar systems (IEC 62369-1:2008)

Nuclear instrumentation - Housed scintillators - Test methods of light output and intrinsic resolution

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010)

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

Video systems (625/50 progressive) - Video and accompanied data using the vertical blanking interval - Analogue interface

Maritime navigation and radiocommunication equipment and systems - Electronic chart system (ECS) - Operational and performance requirements, methods of testing and required test results (IEC 62376:2010)

Common Control Interface for networked audio and video equipment - Part 1: General

Common control interface for networked digital audio and video products - Part 2: Audio (IEC 62379-2:2008)

Common control interface for networked digital audio and video products - Part 3: Video

Common control interface for networked digital audio and video products - Part 5-1: Transmission over networks - General