Search
step 1 - search
2
step 2 - choose
3
step 3 - settings
4
step 4 - order
5
step 5 - pay
Displaying 27553-27564 of 28801 results. Export to excel
LVS EN 62416:2010
standard
EN
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
11.25 €
LVS EN 62417:2010
standard
EN
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
10.02 €
LVS EN 62418:2010
standard
EN
Semiconductor devices - Metallization stress void test (IEC 62418:2010 )
14.87 €
LVS EN 62419:2009
standard
EN
Control technology - Rules for the designation of measuring instruments (IEC 62419:2008)
13.05 €
LVS EN 62420:2009
standard
EN
Concentric lay stranded overhead electrical conductors containing one or more gap(s) (IEC 62420:2008)
19.44 €
LVS EN 62421:2008
standard
EN
Electronics assembly technology - Electronic modules
14.87 €
LVS EN 62423:2013
standard
EN
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses (IEC 62423:2009, modified + corrigendum Dec. 2011)
24.60 €
LVS EN 62423:2013/A11:2021
amendment
EN
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
12.14 €
LVS EN 62423:2013/A12:2022
amendment
EN
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
10.02 €
LVS EN 62424:2017
standard
EN
Representation of process control engineering - Requests in P&I diagrams and data exchange between P&ID tools and PCE-CAE tools
36.13 €
LVS EN 62428:2009
standard
EN
Electric power engineering - Modal components in three-phase a.c. systems - Quantities and transformations (IEC 62428:2008)
17.61 €
LVS EN 62429:2008
standard
EN
Reliability growth - Stress testing for early failures in unique complex systems
21.25 €