ISO/TC 172/SC 9
Registration number (WIID) | Project No. | Title | Status |
---|---|---|---|
83937 | ISO/FDIS 21254-1 | Lasers and laser-related equipment — Test methods for laser-induced damage threshold — Part 1: Definitions and general principles | Izstrādē |
83938 | ISO/PWI 21254-2.2 | Lasers and laser-related equipment — Test methods for laser-induced damage threshold — Part 2: Threshold determination | Izstrādē |
83939 | ISO/PWI 21254-3 | Lasers and laser-related equipment — Test methods for laser-induced damage threshold — Part 3: Assurance of laser power (energy) handling capabilities | Izstrādē |
83940 | ISO 14880-2:2024 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations | Standarts spēkā |
83941 | ISO 14880-3:2024 | Optics and photonics — Microlens arrays — Part 3: Test methods for optical properties other than wavefront aberrations | Standarts spēkā |
83942 | ISO 14880-4:2024 | Optics and photonics — Microlens arrays — Part 4: Test methods for geometrical properties | Standarts spēkā |
85866 | ISO 11554:2025 | Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam radiant power, radiant energy and temporal characteristics | Standarts spēkā |
87908 | ISO 13695:2024 | Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers | Standarts spēkā |
87910 | ISO/DIS 11145 | Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols | Aptauja |
87911 | ISO/DIS 13694 | Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam irradiance (fluence) distribution | Aptauja |
Displaying 131-140 of 146 results.