31.080.99 Other semiconductor devices
Displaying 49-60 of 73 results.
LVS EN 62047-6:2010
standard
EN
Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
12.15 €
LVS EN 62047-7:2011
standard
EN
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011)
16.90 €
LVS EN 62047-8:2011
standard
EN
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011)
12.93 €
LVS EN 62047-9:2011
standard
EN
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011)
16.11 €
LVS CLC/TR 62258-3:2007
standard
EN
Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
20.33 €
LVS CLC/TR 62258-4:2008
standard
EN
Semiconductor die products - Part 4: Questionnaire for die users and suppliers
15.31 €
LVS CLC/TR 62258-4:2013
standard
EN
Semiconductor die products - Part 4: Questionnaire for die users and suppliers (IEC/TR 62258-4:2012)
14.26 €
LVS CLC/TR 62258-7:2008
standard
EN
Semiconductor die products - Part 7: XML schema for data exchange
16.11 €
LVS CLC/TR 62258-8:2009
standard
EN
Semiconductor die products - Part 8: EXPRESS model schema for data exchange (IEC/TR 62258-8:2008)
16.11 €
LVS EN 62258-1:2006
standard
EN
Semiconductor die products - Part 1: Requirements for procurement and use
19.28 €
LVS EN 62258-1:2011
standard
EN
Semiconductor die products - Part 1: Procurement and use (IEC 62258-1:2009)
20.33 €
LVS EN 62258-2:2005
standard
EN
Semiconductor die products - Part 2: Exchange data formats
22.71 €