31.080.99 Other semiconductor devices
Displaying 49-60 of 73 results.
LVS EN 62047-6:2010
standard
EN
Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
13.97 €
LVS EN 62047-7:2011
standard
EN
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011)
19.44 €
LVS EN 62047-8:2011
standard
EN
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011)
14.87 €
LVS EN 62047-9:2011
standard
EN
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011)
18.53 €
LVS CLC/TR 62258-3:2007
standard
EN
Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
23.38 €
LVS CLC/TR 62258-4:2008
standard
EN
Semiconductor die products - Part 4: Questionnaire for die users and suppliers
17.61 €
LVS CLC/TR 62258-4:2013
standard
EN
Semiconductor die products - Part 4: Questionnaire for die users and suppliers (IEC/TR 62258-4:2012)
16.40 €
LVS CLC/TR 62258-7:2008
standard
EN
Semiconductor die products - Part 7: XML schema for data exchange
18.53 €
LVS CLC/TR 62258-8:2009
standard
EN
Semiconductor die products - Part 8: EXPRESS model schema for data exchange (IEC/TR 62258-8:2008)
18.53 €
LVS EN 62258-1:2006
standard
EN
Semiconductor die products - Part 1: Requirements for procurement and use
22.17 €
LVS EN 62258-1:2011
standard
EN
Semiconductor die products - Part 1: Procurement and use (IEC 62258-1:2009)
23.38 €
LVS EN 62258-2:2005
standard
EN
Semiconductor die products - Part 2: Exchange data formats
26.12 €