71.040.40 Chemical analysis
Displaying 133-144 of 249 results.
LVS EN 16785-1:2016
standard
EN
Bio-based products - Bio-based content - Part 1: Determination of the bio-based content using the radiocarbon analysis and elemental analysis
17.61 €
LVS EN 16785-2:2018
standard
EN
Bio-based products - Bio-based content - Part 2: Determination of the bio-based content using the material balance method
13.97 €
ISO 16962:2005
standard
EN
Surface chemical analysis Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
68.85 €
ISO 16962:2017
standard
EN
Surface chemical analysis Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
187.48 €
ISO 17109:2015
standard
EN
Surface chemical analysis Depth profiling Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
68.85 €
ISO 17109:2022
standard
EN
Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
139.82 €
LVS EN 17256:2020
standard
EN
Animal feeding stuffs: Methods of sampling and analysis - Determination of ergot alkaloids and tropane alkaloids in feed materials and compound feeds by LC-MS/MS
21.25 €
LVS EN 17294:2019
standard
EN
Animal feeding stuffs - Methods of sampling and analysis - Determination of organic acids by Ion Chromatography with Conductivity Detection (IC-CD)
20.34 €
LVS EN 17298:2019
standard
EN
Animal feeding stuffs - Methods of sampling and analysis - Determination of benzoic and sorbic acid by High Performance Liquid Chromatography (HPLC)
14.87 €
ISO 17331:2004
standard
EN
Surface chemical analysis Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
103.80 €
ISO 17331:2004/Amd 1:2010
amendment
EN
19.07 €
ISO 17560:2002
standard
EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of boron in silicon
68.85 €