71.040.40 Chemical analysis
Displaying 133-144 of 243 results.
ISO 17109:2022
standard
EN
Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
97.87 €
LVS EN 17256:2020
standard
EN
Animal feeding stuffs: Methods of sampling and analysis - Determination of ergot alkaloids and tropane alkaloids in feed materials and compound feeds by LC-MS/MS
18.48 €
LVS EN 17294:2019
standard
EN
Animal feeding stuffs - Methods of sampling and analysis - Determination of organic acids by Ion Chromatography with Conductivity Detection (IC-CD)
17.69 €
LVS EN 17298:2019
standard
EN
Animal feeding stuffs - Methods of sampling and analysis - Determination of benzoic and sorbic acid by High Performance Liquid Chromatography (HPLC)
12.93 €
ISO 17331:2004
standard
EN
Surface chemical analysis Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
72.66 €
ISO 17331:2004/Amd 1:2010
amendment
EN
13.35 €
ISO 17560:2002
standard
EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of boron in silicon
48.19 €
ISO 17560:2014
standard
EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of boron in silicon
48.19 €
LVS CEN/TR 17674:2021
technical report (TR)
EN
Bio-based products- Use of stable isotope ratios of Carbon, Hydrogen, Oxygen and Nitrogen as tools for verification of the origin of bio-based feedstock and characteristics of production processes - Overview of relevant existing applications
17.69 €
LVS EN 17813:2023
standard
EN
Environmental solid matrices - Determination of halogens and sulfur by oxidative pyrohydrolytic combustion followed by ion chromatography
14.26 €
ISO 17862:2013
standard
EN
Surface chemical analysis Secondary ion mass spectrometry Linearity of intensity scale in single ion counting time-of-flight mass analysers
48.19 €
ISO 17862:2022
standard
EN
Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
72.66 €