71.040.40 Chemical analysis
Displaying 157-168 of 247 results.
ISO 18116:2005
standard
EN
Surface chemical analysis Guidelines for preparation and mounting of specimens for analysis
48.19 €
ISO 18117:2009
standard
EN
Surface chemical analysis Handling of specimens prior to analysis
48.19 €
ISO 18118:2004
standard
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
48.19 €
ISO 18118:2015
standard
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
48.19 €
ISO 18118:2024
standard
EN
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
97.87 €
ISO 18337:2015
standard
EN
Surface chemical analysis Surface characterization Measurement of the lateral resolution of a confocal fluorescence microscope
48.19 €
ISO/TR 18392:2005
technical report (TR)
EN
Surface chemical analysis X-ray photoelectron spectroscopy Procedures for determining backgrounds
48.19 €
ISO/TR 18394:2006
technical report (TR)
EN
Surface chemical analysis Auger electron spectroscopy Derivation of chemical information
48.19 €
ISO/TR 18394:2016
technical report (TR)
EN
Surface chemical analysis Auger electron spectroscopy Derivation of chemical information
97.87 €
ISO/TS 18507:2015
technical specification (TS)
EN
Surface chemical analysis Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
114.92 €
ISO 18516:2006
standard
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Determination of lateral resolution
48.19 €
ISO 18516:2019
standard
EN
Surface chemical analysis Determination of lateral resolution and sharpness in beam based methods with a range from nanometres to micrometres
147.55 €