71.040.40 Chemical analysis

Surface chemical analysis -- Sample handling, preparation and mounting

Surface chemical analysis Guidelines to sample handling, preparation and mounting

Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results

Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results

Chemical analysis of refractories containing alumina, zirconia and silica Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method)

Chemical analysis of refractories containing alumina, zirconia, and silica Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method)

Chemical analysis of refractories containing alumina, zirconia, and silica Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method)

Chemical analysis of refractories containing alumina, zirconia and silica - Refractories containing 5 percent to 45 percent of ZrO<(Index)2> (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents and dissolution

Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 percent to 45 percent of ZrO<(Index)2> (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis

Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 percent to 45 percent of ZrO<(Index)2> (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP -AES)

Surface chemical analysis -- Scanning probe microscopy -- Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale