71.040.40 Chemical analysis

Displaying 205-216 of 249 results.

ISO 23170:2022

standard

EN
Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
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164.18 €

ISO 23729:2022

standard

EN
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
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103.80 €

ISO 23812:2009

standard

EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth calibration for silicon using multiple delta-layer reference materials
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139.82 €

ISO 23830:2008

standard

EN
Surface chemical analysis Secondary-ion mass spectrometry Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
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68.85 €

ISO 24236:2005

standard

EN
Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
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103.80 €

ISO 24237:2005

standard

EN
Surface chemical analysis X-ray photoelectron spectroscopy Repeatability and constancy of intensity scale
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68.85 €

ISO 24417:2022

standard

EN
Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
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164.18 €

ISO 24465:2023

standard

EN
Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
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68.85 €

ISO/TS 25138:2010

technical specification (TS)

EN
Surface chemical analysis Analysis of metal oxide films by glow-discharge optical-emission spectrometry
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68.85 €

ISO/TS 25138:2019

technical specification (TS)

EN
Surface chemical analysis Analysis of metal oxide films by glow-discharge optical-emission spectrometry
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68.85 €

ISO/TS 25138:2025

technical specification (TS)

EN
Surface chemical analysis — Analysis of metal oxide films by glow discharge optical emission spectrometry
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187.48 €

ISO 27911:2011

standard

EN
Surface chemical analysis Scanning-probe microscopy Definition and calibration of the lateral resolution of a near-field optical microscope
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103.80 €