71.040.40 Chemical analysis
Displaying 193-204 of 243 results.
ISO 22048:2004
standard
EN
Surface chemical analysis Information format for static secondary-ion mass spectrometry
48.19 €
ISO/TR 22335:2007
technical report (TR)
EN
Surface chemical analysis Depth profiling Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
72.66 €
ISO 22415:2019
standard
EN
Surface chemical analysis Secondary ion mass spectrometry Method for determining yield volume in argon cluster sputter depth profiling of organic materials
114.92 €
ISO 22581:2021
standard
EN
Surface chemical analysis -- Near real-time information from the X-ray photoelectron spectroscopy survey scan -- Rules for identification of, and correction for, surface contamination by carbon-containing compounds
72.66 €
ISO/TS 22933:2022
technical specification (TS)
EN
Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
72.66 €
ISO 23124:2024
standard
EN
Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
48.19 €
ISO 23170:2022
standard
EN
Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
114.92 €
ISO 23729:2022
standard
EN
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
72.66 €
ISO 23812:2009
standard
EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth calibration for silicon using multiple delta-layer reference materials
97.87 €
ISO 23830:2008
standard
EN
Surface chemical analysis Secondary-ion mass spectrometry Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
48.19 €
ISO 24236:2005
standard
EN
Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
72.66 €
ISO 24237:2005
standard
EN
Surface chemical analysis X-ray photoelectron spectroscopy Repeatability and constancy of intensity scale
48.19 €