71.040.40 Chemical analysis
Displaying 73-84 of 249 results.
ISO 12406:2010
standard
EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of arsenic in silicon
103.80 €
LVS EN 12698-1:2007
standard
EN
Chemical analysis of nitride bonded silicon carbide refractories - Part 1: Chemical methods
20.34 €
LVS EN 12698-2:2007
standard
EN
Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
12.14 €
ISO 12963:2017
standard
EN
Gas analysis Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
139.82 €
ISO 12963:2017/Amd 1:2020
amendment
EN
Correction to Formula 5
19.07 €
ISO 13083:2015
standard
EN
Surface chemical analysis Scanning probe microscopy Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
103.80 €
ISO 13084:2011
standard
EN
Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
68.85 €
ISO 13084:2018
standard
EN
Surface chemical analysis Secondary ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
103.80 €
ISO 13095:2014
standard
EN
Surface Chemical Analysis Atomic force microscopy Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
139.82 €
ISO 13424:2013
standard
EN
Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis
187.48 €
ISO 14167:2018
standard
EN
Gas analysis General quality aspects and metrological traceability of calibration gas mixtures
139.82 €
ISO/TS 14167:2003
technical specification (TS)
EN
Gas analysis General quality assurance aspects in the use of calibration gas mixtures - Guidelines
68.85 €