71.040.40 Chemical analysis
Displaying 85-96 of 251 results.
ISO/TS 14167:2003
technical specification (TS)
EN
Gas analysis General quality assurance aspects in the use of calibration gas mixtures - Guidelines
70.97 €
ISO/TR 14187:2011
technical report (TR)
EN
Surface chemical analysis Characterization of nanostructured materials
70.97 €
ISO/TR 14187:2020
technical report (TR)
EN
Surface chemical analysis -- Characterization of nanostructured materials
191.72 €
ISO 14237:2010
standard
EN
Surface chemical analysis Secondary-ion mass spectrometry Determination of boron atomic concentration in silicon using uniformly doped materials
142.99 €
ISO 14606:2000
standard
EN
Surface chemical analysis Sputter depth profiling Optimization using layered systems as reference materials
70.97 €
ISO 14606:2015
standard
EN
Surface chemical analysis Sputter depth profiling Optimization using layered systems as reference materials
70.97 €
ISO 14606:2022
standard
EN
Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
105.92 €
ISO 14701:2011
standard
EN
Surface chemical analysis X-ray photoelectron spectroscopy Measurement of silicon oxide thickness
70.97 €
ISO 14701:2018
standard
EN
Surface chemical analysis X-ray photoelectron spectroscopy Measurement of silicon oxide thickness
105.92 €
ISO 14706:2000
standard
EN
Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
70.97 €
ISO 14706:2014
standard
EN
Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
142.99 €
ISO 14707:2000
standard
EN
Surface chemical analysis Glow discharge optical emission spectrometry (GD-OES) Introduction to use
70.97 €