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Displaying 23317-23328 of 27364 results.
LVS EN 60747-5-3:2002 +A1
standard
EN
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
23.38 €
LVS EN 60747-5-5:2011
standard
EN
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers (IEC 60747-5-5:2007)
24.60 €
LVS EN 60749-10:2002
standard
EN
Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock
8.81 €
LVS EN 60749-11:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
11.25 €
LVS EN 60749-1:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
11.25 €
LVS EN 60749-12:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibrations, variable frequency
8.81 €
LVS EN 60749-13:2002
standard
EN
Semiconductor devices - Mechanical and climatic test method - Part 13: Salt atmosphere
10.02 €
LVS EN 60749-14:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
13.97 €
LVS EN 60749-15:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
10.02 €
LVS EN 60749-15:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2010)
10.02 €
LVS EN 60749-15:2011 /AC:2011
corrigendum
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
0.00 €
LVS EN 60749-16:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
10.02 €