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Displaying 23353-23364 of 27364 results.

LVS EN 60749-3:2002

standard

EN
Semiconductor devices - Mechanical and climatic test method - Part 3: External visual inspection
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8.81 €

LVS EN 60749-32:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
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10.02 €

LVS EN 60749-32:2003 /A1:2011

amendment

EN
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002/A1:2010)
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7.59 €

LVS EN 60749-32:2003 /AC:2003

corrigendum

EN
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
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0.00 €

LVS EN 60749-33:2004

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
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10.02 €

LVS EN 60749-34:2004

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
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11.25 €

LVS EN 60749-34:2011

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010)
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12.14 €

LVS EN 60749-35:2007

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
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17.61 €

LVS EN 60749-36:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration steady state
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8.81 €

LVS EN 60749-37:2008

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using a accelerometer
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16.40 €

LVS EN 60749-38:2008

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
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13.05 €

LVS EN 60749-39:2006

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
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11.25 €