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Displaying 23341-23352 of 27364 results.
LVS EN 60749-23:2004
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
11.25 €
LVS EN 60749-23:2004 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004/A1:2011)
7.59 €
LVS EN 60749-24:2004
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST
11.25 €
LVS EN 60749-25:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
13.97 €
LVS EN 60749-26:2006
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
13.97 €
LVS EN 60749-27:2006
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
13.05 €
LVS EN 60749-27:2006 /A1:2013
amendment
EN
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006/A1:2012)
7.59 €
LVS EN 60749-29:2004 +AC
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
17.61 €
LVS EN 60749-29:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011)
17.61 €
LVS EN 60749-30:2005
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
13.97 €
LVS EN 60749-30:2005 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005/A1:2011)
8.81 €
LVS EN 60749-31:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
8.81 €