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Displaying 23329-23340 of 27364 results.
LVS EN 60749-17:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
10.02 €
LVS EN 60749-18:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
13.97 €
LVS EN 60749-19:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
10.02 €
LVS EN 60749-19:2003 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength test (IEC 60749-19:2003/A1:2010)
5.35 €
LVS EN 60749-19:2003 /AC:2003
corrigendum
EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
0.00 €
LVS EN 60749-20-1:2009
standard
EN
Semiconductor devices - Mechanical and climatic test methods -- Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 60749-20-1:2009)
20.34 €
LVS EN 60749-20:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
18.53 €
LVS EN 60749-20:2010
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2008)
19.44 €
LVS EN 60749-21:2005
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
16.40 €
LVS EN 60749-21:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2011)
17.61 €
LVS EN 60749-2:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
10.02 €
LVS EN 60749-22:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
17.61 €