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Displaying 23365-23376 of 27364 results.
LVS EN 60749-40:2012
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011)
17.61 €
LVS EN 60749-4:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
11.25 €
LVS EN 60749-5:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
11.25 €
LVS EN 60749-6:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
8.81 €
LVS EN 60749-7:2002
standard
EN
Semiconductor devices - Mechanical and climatic test method - Part 7: Internal moisture content measurement and the analysis of other residual gases
11.25 €
LVS EN 60749-7:2012
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2011)
12.14 €
LVS EN 60749-8:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
14.87 €
LVS EN 60749-9:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
10.02 €
LVS EN 60751:2003 +A2
standard
EN
Industrial platinum resistance thermometer sensors
16.40 €
LVS EN 60751:2009
standard
EN
Industrial platinum resistance thermometers and platinum temperature sensors (IEC 60751:2008)
17.61 €
LVS EN 60756:2002
standard
EN
Non-broadcast video tape recorders - Time base stability
8.81 €
LVS EN 60758:2005
standard
EN
Synthetic quartz crystal - Specifications and guide to the use
23.38 €