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Displaying 24373-24384 of 28803 results. Export to excel
LVS EN 60749-14:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
13.97 €
LVS EN 60749-16:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
10.02 €
LVS EN 60749-19:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
10.02 €
LVS EN 60749-19:2003 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength test (IEC 60749-19:2003/A1:2010)
5.35 €
LVS EN 60749-19:2003 /AC:2003
corrigendum
EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
0.00 €
LVS EN 60749-2:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
10.02 €
LVS EN 60749-25:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
13.97 €
LVS EN 60749-27:2006
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
13.05 €
LVS EN 60749-27:2006 /A1:2013
amendment
EN
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006/A1:2012)
7.59 €
LVS EN 60749-29:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011)
17.61 €
LVS EN 60749-31:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
8.81 €
LVS EN 60749-3:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
13.05 €