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Displaying 24409-24420 of 28803 results. Export to excel
LVS EN IEC 60749-22-1:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods
26.12 €
LVS EN IEC 60749-22-2:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
21.25 €
LVS EN IEC 60749-23:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
12.14 €
LVS EN IEC 60749-24:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
12.14 €
LVS EN IEC 60749-26:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
24.60 €
LVS EN IEC 60749-28:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
24.60 €
LVS EN IEC 60749-30:2020
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
13.05 €
LVS EN IEC 60749-34-1:2025
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
20.34 €
LVS EN IEC 60749-37:2023
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
17.61 €
LVS EN IEC 60749-39:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
13.05 €
LVS EN IEC 60749-41:2020
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
17.61 €
LVS EN IEC 60749-5:2024
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
12.14 €