Search
step 1 - search
2
step 2 - choose
3
step 3 - settings
4
step 4 - order
5
step 5 - pay
Displaying 24385-24396 of 28803 results. Export to excel
LVS EN 60749-32:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
10.02 €
LVS EN 60749-32:2003 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002/A1:2010)
7.59 €
LVS EN 60749-32:2003 /AC:2003
corrigendum
EN
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
0.00 €
LVS EN 60749-33:2004
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
10.02 €
LVS EN 60749-34:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010)
12.14 €
LVS EN 60749-35:2007
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
17.61 €
LVS EN 60749-36:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration steady state
8.81 €
LVS EN 60749-38:2008
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
13.05 €
LVS EN 60749-40:2012
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011)
17.61 €
LVS EN 60749-4:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
12.14 €
LVS EN 60749-42:2015
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
11.25 €
LVS EN 60749-44:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
16.40 €