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Displaying 24397-24408 of 28803 results. Export to excel
LVS EN 60749-6:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
11.25 €
LVS EN 60749-8:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
14.87 €
LVS EN 60749-9:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
11.25 €
LVS EN IEC 60749-10:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
13.05 €
LVS EN IEC 60749-12:2018
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
10.02 €
LVS EN IEC 60749-13:2018
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
13.97 €
LVS EN IEC 60749-15:2020
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
12.14 €
LVS EN IEC 60749-17:2019
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
11.25 €
LVS EN IEC 60749-18:2019
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
17.61 €
LVS EN IEC 60749-20-1:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
22.17 €
LVS EN IEC 60749-20:2021
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
19.44 €
LVS EN IEC 60749-21:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
17.61 €