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LVS EN IEC 60747-16-9:2024
standard
EN
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
22.17 €
LVS EN IEC 60747-17:2021
standard
EN
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
24.60 €
LVS EN IEC 60747-17:2021/AC:2021
corrigendum
FR, EN
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
0.00 €
LVS EN IEC 60747-5-5:2020
standard
EN
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
24.60 €
LVS EN 60749-11:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
11.25 €
LVS EN 60749-1:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
11.25 €
LVS EN 60749-14:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
13.97 €
LVS EN 60749-16:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
10.02 €
LVS EN 60749-19:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
10.02 €
LVS EN 60749-19:2003 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength test (IEC 60749-19:2003/A1:2010)
5.35 €
LVS EN 60749-19:2003 /AC:2003
corrigendum
EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
0.00 €
LVS EN 60749-2:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
10.02 €