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Displaying 24361-24372 of 28763 results. Export to excel
LVS EN IEC 60749-15:2020
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
12.14 €
LVS EN IEC 60749-17:2019
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
11.25 €
LVS EN IEC 60749-18:2019
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
17.61 €
LVS EN IEC 60749-20-1:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
22.17 €
LVS EN IEC 60749-20:2021
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
19.44 €
LVS EN IEC 60749-21:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
17.61 €
LVS EN IEC 60749-22-1:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods
26.12 €
LVS EN IEC 60749-22-2:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
21.25 €
LVS EN IEC 60749-23:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
12.14 €
LVS EN IEC 60749-24:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
12.14 €
LVS EN IEC 60749-26:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
24.60 €
LVS EN IEC 60749-28:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
24.60 €