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LVS EN 60749-36:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration steady state
8.81 €
LVS EN 60749-38:2008
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
13.05 €
LVS EN 60749-40:2012
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011)
17.61 €
LVS EN 60749-4:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
12.14 €
LVS EN 60749-42:2015
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
11.25 €
LVS EN 60749-44:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
16.40 €
LVS EN 60749-6:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
11.25 €
LVS EN 60749-8:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
14.87 €
LVS EN 60749-9:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
11.25 €
LVS EN IEC 60749-10:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
13.05 €
LVS EN IEC 60749-12:2018
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
10.02 €
LVS EN IEC 60749-13:2018
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
13.97 €