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LVS EN 60749-25:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
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13.97 €

LVS EN 60749-27:2006

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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13.05 €

LVS EN 60749-27:2006 /A1:2013

amendment

EN
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006/A1:2012)
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7.59 €

LVS EN 60749-29:2011

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011)
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17.61 €

LVS EN 60749-31:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
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8.81 €

LVS EN 60749-3:2017

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
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13.05 €

LVS EN 60749-32:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
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10.02 €

LVS EN 60749-32:2003 /A1:2011

amendment

EN
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002/A1:2010)
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7.59 €

LVS EN 60749-32:2003 /AC:2003

corrigendum

EN
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
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0.00 €

LVS EN 60749-33:2004

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
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10.02 €

LVS EN 60749-34:2011

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010)
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12.14 €

LVS EN 60749-35:2007

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
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17.61 €