31.080.01 Semiconductor devices in general
Displaying 109-120 of 137 results.
LVS EN IEC 60749-37:2023
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
17.61 €
LVS EN IEC 60749-39:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
13.05 €
LVS EN IEC 60749-41:2020
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
17.61 €
LVS EN IEC 60749-5:2024
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
12.14 €
LVS EN IEC 60749-7:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
13.97 €
prEN IEC 60749-20-1
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
0.00 €
IEC 60796-1:1990
standard
EN
Microprocessor system bus -- 8-bit and 16-bit data (MULTIBUS I)
354.84 €
IEC 60796-2:1990
standard
EN
Microprocessor system bus -- 8-bit and 16-bit data (MULTIBUS I)
42.37 €
IEC 60796-3:1990
standard
EN
Microprocessor system BUS I, 8-bit and 16-bit data (MULTIBUS I)
42.37 €
IEC 60821:1991
standard
EN
VMEbus -- Microprocessor system bus for 1 byte to 4 byte data
503.12 €
IEC 60822:1988
standard
EN
Parallel Sub-system Bus of the IEC 821 VME bus
455.46 €
LVS EN 61975:2011
standard
EN
High-voltage direct current (HVDC) installations - System tests (IEC 61975:2010)
29.76 €