31.080.01 Semiconductor devices in general
Displaying 61-72 of 127 results.
LVS EN 60749-30:2005
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
12.15 €
LVS EN 60749-30:2005 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005/A1:2011)
7.66 €
LVS EN 60749-31:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
7.66 €
LVS EN 60749-3:2002
standard
EN
Semiconductor devices - Mechanical and climatic test method - Part 3: External visual inspection
7.66 €
LVS EN 60749-3:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
11.35 €
LVS EN 60749-32:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
8.71 €
LVS EN 60749-32:2003 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002/A1:2010)
6.60 €
LVS EN 60749-32:2003 /AC:2003
corrigendum
EN
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
0.00 €
LVS EN 60749-33:2004
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
8.71 €
LVS EN 60749-34:2004
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
9.78 €
LVS EN 60749-34:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010)
10.56 €
LVS EN 60749-35:2007
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
15.31 €