31.080.01 Semiconductor devices in general
Displaying 25-36 of 127 results.
LVS EN 60747-15:2004
standard
EN
Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
21.39 €
LVS EN 60747-5-5:2011
standard
EN
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers (IEC 60747-5-5:2007)
21.39 €
LVS EN 60747-5-5:2011/A1:2015
amendment
EN
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
7.66 €
LVS EN IEC 60747-5-5:2020
standard
EN
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
21.39 €
LVS EN 60749-10:2002
standard
EN
Semiconductor devices - Mechanical and climatic test method - Part 10: Mechanical shock
7.66 €
LVS EN 60749-11:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
9.78 €
LVS EN 60749-1:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
9.78 €
LVS EN 60749-12:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibrations, variable frequency
7.66 €
LVS EN 60749-13:2002
standard
EN
Semiconductor devices - Mechanical and climatic test method - Part 13: Salt atmosphere
8.71 €
LVS EN 60749-14:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
12.15 €
LVS EN 60749-15:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
8.71 €
LVS EN 60749-15:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2010)
8.71 €