31.080.01 Semiconductor devices in general

Displaying 37-48 of 129 results.

LVS EN 60749-15:2011 /AC:2011

corrigendum

EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
View

0.00 €

LVS EN 60749-16:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
View

10.02 €

LVS EN 60749-17:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
View

10.02 €

LVS EN 60749-18:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
View

13.97 €

LVS EN 60749-19:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
View

10.02 €

LVS EN 60749-19:2003 /A1:2011

amendment

EN
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength test (IEC 60749-19:2003/A1:2010)
View

5.35 €

LVS EN 60749-19:2003 /AC:2003

corrigendum

EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
View

0.00 €

LVS EN 60749-20-1:2009

standard

EN
Semiconductor devices - Mechanical and climatic test methods -- Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 60749-20-1:2009)
View

20.34 €

LVS EN 60749-20:2003

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
View

18.53 €

LVS EN 60749-20:2010

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2008)
View

19.44 €

LVS EN 60749-21:2005

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
View

16.40 €

LVS EN 60749-21:2011

standard

EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2011)
View

17.61 €