31.080.01 Semiconductor devices in general
Displaying 37-48 of 127 results.
LVS EN 60749-15:2011 /AC:2011
corrigendum
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
0.00 €
LVS EN 60749-16:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
8.71 €
LVS EN 60749-17:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
8.71 €
LVS EN 60749-18:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
12.15 €
LVS EN 60749-19:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
8.71 €
LVS EN 60749-19:2003 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength test (IEC 60749-19:2003/A1:2010)
4.65 €
LVS EN 60749-19:2003 /AC:2003
corrigendum
EN
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
0.00 €
LVS EN 60749-20-1:2009
standard
EN
Semiconductor devices - Mechanical and climatic test methods -- Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 60749-20-1:2009)
17.69 €
LVS EN 60749-20:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
16.11 €
LVS EN 60749-20:2010
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2008)
16.90 €
LVS EN 60749-21:2005
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
14.26 €
LVS EN 60749-21:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2011)
15.31 €