31.080.01 Semiconductor devices in general
Displaying 49-60 of 127 results.
LVS EN 60749-2:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
8.71 €
LVS EN 60749-22:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
15.31 €
LVS EN 60749-23:2004
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
9.78 €
LVS EN 60749-23:2004 /A1:2011
amendment
EN
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004/A1:2011)
6.60 €
LVS EN 60749-24:2004
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST
9.78 €
LVS EN 60749-25:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
12.15 €
LVS EN 60749-26:2015
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
19.28 €
LVS EN 60749-27:2006
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
11.35 €
LVS EN 60749-27:2006 /A1:2013
amendment
EN
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006/A1:2012)
6.60 €
LVS EN 60749-28:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
20.33 €
LVS EN 60749-29:2004 +AC
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
15.31 €
LVS EN 60749-29:2011
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011)
15.31 €