31.080.01 Semiconductor devices in general
Displaying 85-96 of 129 results.
LVS EN 60749-6:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
8.81 €
LVS EN 60749-6:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
11.25 €
LVS EN 60749-7:2002
standard
EN
Semiconductor devices - Mechanical and climatic test method - Part 7: Internal moisture content measurement and the analysis of other residual gases
11.25 €
LVS EN 60749-7:2012
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2011)
12.14 €
LVS EN 60749-8:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
14.87 €
LVS EN 60749-9:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
10.02 €
LVS EN 60749-9:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
11.25 €
LVS EN IEC 60749-10:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
13.05 €
LVS EN IEC 60749-12:2018
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
10.02 €
LVS EN IEC 60749-13:2018
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
13.97 €
LVS EN IEC 60749-15:2020
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
12.14 €
LVS EN IEC 60749-17:2019
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
11.25 €