31.080.01 Semiconductor devices in general
Displaying 97-108 of 133 results.
LVS EN IEC 60749-18:2019
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
17.61 €
LVS EN IEC 60749-20:2021
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
19.44 €
LVS EN IEC 60749-21:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
17.61 €
LVS EN IEC 60749-22-1:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods
26.12 €
LVS EN IEC 60749-24:2026
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
12.14 €
LVS EN IEC 60749-26:2018
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
24.60 €
LVS EN IEC 60749-28:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
24.60 €
LVS EN IEC 60749-30:2020
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
13.05 €
LVS EN IEC 60749-34-1:2025
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
20.34 €
LVS EN IEC 60749-37:2023
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
17.61 €
LVS EN IEC 60749-39:2022
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
13.05 €
LVS EN IEC 60749-41:2020
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
17.61 €