31.080.01 Semiconductor devices in general
Displaying 73-84 of 127 results.
LVS EN 60749-36:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration steady state
7.66 €
LVS EN 60749-37:2008
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using a accelerometer
14.26 €
LVS EN 60749-38:2008
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
11.35 €
LVS EN 60749-39:2006
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
9.78 €
LVS EN 60749-40:2012
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011)
15.31 €
LVS EN 60749-4:2002
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
9.78 €
LVS EN 60749-4:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
10.56 €
LVS EN 60749-42:2015
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
9.78 €
LVS EN 60749-43:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
19.28 €
LVS EN 60749-44:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
14.26 €
LVS EN 60749-5:2003
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
9.78 €
LVS EN 60749-5:2017
standard
EN
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
10.56 €