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IEC 62788-1-5:2016 provides a method for measuring the maximum representative change in linear dimensions of encapsulation sheet material in an unrestricted thermal exposure as might or might not be seen during photovoltaic (PV) module fabrication. Data obtained using this method may be used by encapsulation material manufacturers for the purpose of quality control of their encapsulation material as well as for reporting in product datasheets. Data obtained using this method may be used by PV module manufacturers for the purpose of material acceptance, process development, design analysis, or failure analysis.
Reģistrācijas numurs (WIID)
60551
Darbības sfēra
IEC 62788-1-5:2016 provides a method for measuring the maximum representative change in linear dimensions of encapsulation sheet material in an unrestricted thermal exposure as might or might not be seen during photovoltaic (PV) module fabrication. Data obtained using this method may be used by encapsulation material manufacturers for the purpose of quality control of their encapsulation material as well as for reporting in product datasheets. Data obtained using this method may be used by PV module manufacturers for the purpose of material acceptance, process development, design analysis, or failure analysis.
