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IEC 60512-21-1:2010 when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to determine the value of RF shunt resistance which degrades the quality factor of an L/C circuit when a connector is connected in parallel. This value is expressed in terms of a parallel damping resistance.
Reģistrācijas numurs (WIID)
50553
Darbības sfēra
IEC 60512-21-1:2010 when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to determine the value of RF shunt resistance which degrades the quality factor of an L/C circuit when a connector is connected in parallel. This value is expressed in terms of a parallel damping resistance.
