CLC/SR 47A
| Projekta Nr. | EN 62433-3:2017 |
|---|---|
| Nosaukums | <p class="PARAGRAPH"> IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.<o:p></o:p> |
| Reģistrācijas numurs (WIID) | 60856 |
| Darbības sfēra | <p class="PARAGRAPH"> IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.<o:p></o:p> |
| Statuss | Standarts spēkā |
| ICS grupa | 31.200 33.100.10 |