Informējam, ka Sistēma pielāgota darbam ar interneta pārlūkprogrammu Internet Explorer (8. un jaunākām versijām) un Mozilla Firefox (3.6 un jaunākām versijām).
Izmantojot citu interneta pārlūkprogrammu, brīdinām, ka Sistēmas funkcionalitāte var tikt traucēta.
This document specifies seven inductively coupled plasma emission spectrometry methods (A to G) for the determination of alloying elements and impurities in copper and copper alloys in the form of unwrought, wrought and cast products.
These methods are applicable to the elements listed in Tables 1 to 7 within the composition ranges shown:
Table 1 - Coppers
Table 2 - Copper-zinc alloys
Table 3 - Copper-tin alloys
Table 4 - Copper-aluminium alloys
Table 5 - Copper-beryllium alloys
Table 6 - Copper-nickel alloys
Table 7 - Copper-tin-lead alloys
NOTE 1 The ranges specified for each method can be extended or adapted, for the determination of lower mass frac-tions.
NOTE 2 Other elements may be included. However such elements and their mass fractions should be carefully checked, taking into account interference, sensitivity, resolution and linearity criteria for each instrument and each wave-length.
Reģistrācijas numurs (WIID)
27669
Darbības sfēra
This document specifies seven inductively coupled plasma emission spectrometry methods (A to G) for the determination of alloying elements and impurities in copper and copper alloys in the form of unwrought, wrought and cast products.
These methods are applicable to the elements listed in Tables 1 to 7 within the composition ranges shown:
Table 1 - Coppers
Table 2 - Copper-zinc alloys
Table 3 - Copper-tin alloys
Table 4 - Copper-aluminium alloys
Table 5 - Copper-beryllium alloys
Table 6 - Copper-nickel alloys
Table 7 - Copper-tin-lead alloys
NOTE 1 The ranges specified for each method can be extended or adapted, for the determination of lower mass frac-tions.
NOTE 2 Other elements may be included. However such elements and their mass fractions should be carefully checked, taking into account interference, sensitivity, resolution and linearity criteria for each instrument and each wave-length.