CEN/TC 184
| Projekta Nr. | CEN/TS 1071-10:2004 |
|---|---|
| Nosaukums | This document specifies a method of measuring the thickness of ceramic coatings by means of examination of a metallographically prepared cross-section of the coating in a calibrated optical or scanning electron microscope. It draws strongly on EN ISO 9220 [8], modifying and updating as required to be relevant to ceramic coatings and current best practice. |
| Reģistrācijas numurs (WIID) | 8223 |
| Darbības sfēra | This document specifies a method of measuring the thickness of ceramic coatings by means of examination of a metallographically prepared cross-section of the coating in a calibrated optical or scanning electron microscope. It draws strongly on EN ISO 9220 [8], modifying and updating as required to be relevant to ceramic coatings and current best practice. |
| Statuss | Atcelts |
| ICS grupa | 17.040.20 25.220.99 81.060.30 |