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This document describes methods for the measurement of the thickness of coatings by means of thermal waves generated by a radiation source.
The method can be used for coatings whose thermal properties (e.g. thermal conductivity) are different from those of the substrates in a range from a few microns to some hundred microns.
Reģistrācijas numurs (WIID)
23827
Darbības sfēra
This document describes methods for the measurement of the thickness of coatings by means of thermal waves generated by a radiation source.
The method can be used for coatings whose thermal properties (e.g. thermal conductivity) are different from those of the substrates in a range from a few microns to some hundred microns.
