CEN/TC 262
| Projekta Nr. | EN ISO 1463:2004 |
|---|---|
| Nosaukums | ISO 1463:2002 describes a method for the measurement of the local thickness of metallic coatings, oxide layers, and porcelain or vitreous enamel coatings, by the microscopical examination of cross-sections using an optical microscope. |
| Reģistrācijas numurs (WIID) | 13525 |
| Darbības sfēra | ISO 1463:2002 describes a method for the measurement of the local thickness of metallic coatings, oxide layers, and porcelain or vitreous enamel coatings, by the microscopical examination of cross-sections using an optical microscope. |
| Statuss | Atcelts |
| ICS grupa | 17.040.20 25.220.40 |