Informējam, ka Sistēma pielāgota darbam ar interneta pārlūkprogrammu Internet Explorer (8. un jaunākām versijām) un Mozilla Firefox (3.6 un jaunākām versijām).
Izmantojot citu interneta pārlūkprogrammu, brīdinām, ka Sistēmas funkcionalitāte var tikt traucēta.
This document specifies a method for determining optical and dielectric constants in the UV-VIS-NIR
spectral range as well as layer thicknesses in the field of at-line production control, quality assurance and
material development through accredited test laboratories.
It is applicable to stand-alone measuring systems. The presentation of the uncertainty of results conforms
to ISO/IEC Guide 98-3.
Reģistrācijas numurs (WIID)
84586
Darbības sfēra
This document specifies a method for determining optical and dielectric constants in the UV-VIS-NIR
spectral range as well as layer thicknesses in the field of at-line production control, quality assurance and
material development through accredited test laboratories.
It is applicable to stand-alone measuring systems. The presentation of the uncertainty of results conforms
to ISO/IEC Guide 98-3.
