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X-ray Fluorescence Spectrometry (XRF) has been used for several decades as an important analytical tool for production analysis. XRF is characterised by its speed and high precision over a wide concentration range and since the technique in most cases is used as an relative method the limitations are often connected to the quality of the calibration samples. The technique is well established and most of its physical properties are well known.
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X-ray Fluorescence Spectrometry (XRF) has been used for several decades as an important analytical tool for production analysis. XRF is characterised by its speed and high precision over a wide concentration range and since the technique in most cases is used as an relative method the limitations are often connected to the quality of the calibration samples. The technique is well established and most of its physical properties are well known.
