CEN/TC 290

Projekta Nr.LVS EN ISO 25178-607:2019
NosaukumsThis part of ISO 25178 describes the metrological characteristics of confocal microscopy (CM) systems for 3D mapping of surface topography.
Reģistrācijas numurs (WIID)60591
Darbības sfēraThis part of ISO 25178 describes the metrological characteristics of confocal microscopy (CM) systems for 3D mapping of surface topography.
StatussStandarts spēkā
ICS grupa17.040.20