CEN/TC 290
| Projekta Nr. | LVS EN ISO 25178-73:2019 |
|---|---|
| Nosaukums | This part of ISO 25178 deals with geometrical defects that may be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70. It defines classes of these geometrical defects, and defines terms for ways of responding to these defects. This part of ISO 25178 is applicable as follows: a) to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when purchasing them from manufacturers and suppliers; b) to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimise the uncertainty of their own measurements. c) to enable calibration laboratories and their customers to agree a common policy on how to treat defects on a material measure that has been sent for calibration; d) to educate users of material measures about the different significance and importance of different kinds of defect; e) for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or to be avoided in measurement. |
| Reģistrācijas numurs (WIID) | 60370 |
| Darbības sfēra | This part of ISO 25178 deals with geometrical defects that may be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70. It defines classes of these geometrical defects, and defines terms for ways of responding to these defects. This part of ISO 25178 is applicable as follows: a) to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when purchasing them from manufacturers and suppliers; b) to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimise the uncertainty of their own measurements. c) to enable calibration laboratories and their customers to agree a common policy on how to treat defects on a material measure that has been sent for calibration; d) to educate users of material measures about the different significance and importance of different kinds of defect; e) for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or to be avoided in measurement. |
| Statuss | Standarts spēkā |
| ICS grupa | 17.040.40 01.040.17 |