Projekta Nr.LVS EN ISO 25178-604:2025
NosaukumsThis document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.
Reģistrācijas numurs (WIID)76821
Darbības sfēraThis document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.
StatussNav uzstādīts
ICS grupa17.040.20