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<p>Defines a method for deriving minimum elevated temperature lower yield or proof stress values for inclusion in International Standards. Defines further a verification procedure which may be used by a manufacturer as an alternative to hot-testing for satisfying the purchaser that his product meets the specified minimum elevated temperature proof stress values.</p>
Reģistrācijas numurs (WIID)
7597
Darbības sfēra
<p>Defines a method for deriving minimum elevated temperature lower yield or proof stress values for inclusion in International Standards. Defines further a verification procedure which may be used by a manufacturer as an alternative to hot-testing for satisfying the purchaser that his product meets the specified minimum elevated temperature proof stress values.</p>
