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<p>The method specified is applicable to sulfur contents between 0,0003 % (m/m) and 0,010 % (m/m). However, niobium, silicon, tantalum and titanium interfere in the determination of sulfur, and application range and test portion masses of the method depend on the concentration of the interfering elements.</p>
Reģistrācijas numurs (WIID)
91295
Darbības sfēra
<p>The method specified is applicable to sulfur contents between 0,0003 % (m/m) and 0,010 % (m/m). However, niobium, silicon, tantalum and titanium interfere in the determination of sulfur, and application range and test portion masses of the method depend on the concentration of the interfering elements.</p>
